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Tracer Optimization & Relaxometry
說明
Tracer優化和Relaxometry測量

MOMENTUM 磁粒子成像系統的軟體模組。

使用"RELAX™模組再直接在 MOMENTUM磁性粒子成像系統上篩選和優化您的磁性奈米粒子。

磁性粒子照影可檢測奈米磁性粒子,可生成高靈敏度、高對比度的圖像,並可用於定量研究。磁性照影的靈活性和應用性高度依賴於使的Tracer。利用Relaxometry的測量,可以在不同大小、組成、結構、材質、Coating等特性變化中找出最適合的Tracer。Tracer的屬性差異,決定了圖像品質、靈敏度和解析度。通過使用 RELAX Module針對您的特定應用,找尋最佳特性的Tracer,達到最高的影像品質。

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Description
Relax

Tracer Optimization & Relaxometry

Software Module for the MOMENTUM Magnetic Particle Imaging System

Screen and optimize your nanoparticle directly on the MOMENTUM™ Magnetic Particle Imaging System with the RELAX™ particle re/nanotechnology/laxometry module.

Magnetic Particle Imaging detects nanoparticles to produce high contrast images with unparalleled sensitivity and quantitation. The flexibility and breadth of applications is highly dependent on the particle used. Tracer properties can vary widely and determine image quality, sensitivity and resolution. Get the most out of your tracer by using RELAX for your specific application.

Link To Relax!
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